For early signs of crop stress, such as drought, can be obtained by examining the root system. But in order to correctly study the roots, most often it is necessary to damage the plant. American scientists from the National Laboratory. Lawrence in Berkeley (California) developed a special sensor apparatus for studying the root characteristics of plants, which allows obtaining information about the root without injuring the plant itself.
We are talking about a tomographic electric scanner of the rhizosphere (TERI). The device can collect data on the characteristics of the roots (length, mass and diameter). Innovative touch sensors work by sending a small amount of electrical current into the plant stem. The sensor, by non-invasively sensing the electrical response of the roots and soil, provides information on the required characteristics of the root.
So far, the technology has been tested on soybeans and corn. Queue for potatoes. This approach can help scientists look at crop production from a completely new perspective.